{"id":13638,"date":"2019-08-30T02:32:43","date_gmt":"2019-08-30T02:32:43","guid":{"rendered":"https:\/\/www.meetyoucarbide.com\/?p=13638"},"modified":"2020-05-07T01:18:12","modified_gmt":"2020-05-07T01:18:12","slug":"application-of-scanning-electron-microscope-in-material-analysis","status":"publish","type":"post","link":"https:\/\/www.meetyoucarbide.com\/tr\/application-of-scanning-electron-microscope-in-material-analysis\/","title":{"rendered":"Taramal\u0131 Elektron Mikroskobunun Malzeme Analizinde Uygulanmas\u0131"},"content":{"rendered":"
\n

\u0130lk ticari taramal\u0131 elektron mikroskobunun 1965'te ortaya \u00e7\u0131kmas\u0131ndan bu yana, 40 y\u0131ll\u0131k s\u00fcrekli iyile\u015ftirmenin ard\u0131ndan, taramal\u0131 elektron mikroskobunun \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc ilkinin 25 nm'sinden 0.01 nm'ye y\u00fckseldi. \u00c7o\u011fu taramal\u0131 elektron mikroskobu, y\u00fczey mikro d\u00fcnyas\u0131n\u0131n kapsaml\u0131 bir analizi haline gelen X-\u0131\u015f\u0131n\u0131 spektrometresi ve X-\u0131\u015f\u0131n\u0131 enerji spektrometresi ile birle\u015ftirilebilir. \u00c7ok i\u015flevli elektron mikroskobu aleti. Taramal\u0131 elektron mikroskobu (SEM), \u00e7e\u015fitli bilimsel alanlarda ve end\u00fcstriyel sekt\u00f6rlerde yayg\u0131n olarak kullan\u0131lan g\u00fc\u00e7l\u00fc bir ara\u00e7 haline geldi. Taramal\u0131 elektron mikroskobu (SEM), jeoloji, biyoloji, t\u0131p, metal\u00fcrji, mekanik i\u015fleme, malzeme, yar\u0131 iletken \u00fcretimi ve seramik denetimi gibi bir\u00e7ok alanda yayg\u0131n olarak kullan\u0131lmaktad\u0131r.<\/p>\n\n\n\n

Taramal\u0131 elektron mikroskobu (SEM), malzeme alan\u0131nda son derece \u00f6nemli bir rol oynamaktad\u0131r. \u00c7e\u015fitli malzemelerin morfolojisi, aray\u00fcz durumu, hasar mekanizmas\u0131 ve malzeme performans tahmini \u00e7al\u0131\u015fmalar\u0131nda yayg\u0131n olarak kullan\u0131lmaktad\u0131r. Taramal\u0131 elektron mikroskobu (SEM), kristal kusurlar\u0131n\u0131 ve bunlar\u0131n \u00fcretim s\u00fcrecini do\u011frudan incelemek i\u00e7in kullan\u0131labilir. Metal malzemelerdeki atomlar\u0131n toplanma modunu ve ger\u00e7ek s\u0131n\u0131rlar\u0131n\u0131 g\u00f6zlemleyebilir. Farkl\u0131 ko\u015fullar alt\u0131nda s\u0131n\u0131rlar\u0131n hareket modunu da g\u00f6zlemleyebilir. Y\u00fczey i\u015flemede kristalin neden oldu\u011fu hasar\u0131 ve radyasyon hasar\u0131n\u0131 da kontrol edebilir.<\/p>\n\n\n\n

Taramal\u0131 Elektron Mikroskobunun \u00c7al\u0131\u015fma Prensibi<\/h2>\n\n\n\n
\"\"<\/figure>\n\n\n\n

Taramal\u0131 elektron mikroskobunun \u00e7al\u0131\u015fma prensibi \u015fekilde g\u00f6sterilmi\u015ftir. <\/p>\n\n\n\n

\u015eekil 1 Taramal\u0131 elektron mikroskobu \u015fematik diyagram\u0131<\/p>\n\n\n\n

Taramal\u0131 elektron mikroskobu (SEM), bir elektron tabancas\u0131ndan yay\u0131lan elektron \u0131\u015f\u0131nlar\u0131ndan olu\u015fur. H\u0131zland\u0131r\u0131lm\u0131\u015f voltaj\u0131n etkisi alt\u0131nda, elektron \u0131\u015f\u0131nlar\u0131, 5 nm \u00e7ap\u0131nda bir elektronik optik sistem olu\u015fturmak i\u00e7in bir manyetik mercek sisteminde birle\u015fir. \u0130ki veya \u00fc\u00e7 elektromanyetik mercekten sonra, elektron demetleri, numunenin y\u00fczeyine odaklanan ince bir elektron demetinde birle\u015fir. Nihai merce\u011fin \u00fcst taraf\u0131na, elektron \u0131\u015f\u0131n\u0131n\u0131n numunenin y\u00fczeyinde tarand\u0131\u011f\u0131 bir tarama bobini monte edilmi\u015ftir. Y\u00fcksek enerjili elektron \u0131\u015f\u0131nlar\u0131 ve numune malzemeleri aras\u0131ndaki etkile\u015fim nedeniyle, \u00e7e\u015fitli t\u00fcrde bilgiler \u00fcretilir: ikincil elektronlar, geri yans\u0131ma elektronlar\u0131, absorpsiyon elektronlar\u0131, X-\u0131\u015f\u0131n\u0131, Auger elektronlar\u0131, katodol\u00fcminesans ve transmisyon elektronlar\u0131. Bu sinyaller ilgili al\u0131c\u0131 taraf\u0131ndan al\u0131n\u0131r, y\u00fckseltilir ve resim t\u00fcp\u00fcn\u00fcn parlakl\u0131\u011f\u0131n\u0131 mod\u00fcle etmek i\u00e7in resim t\u00fcp\u00fcn\u00fcn kap\u0131s\u0131na g\u00f6nderilir. Tarama bobinindeki ak\u0131m, resim t\u00fcp\u00fcn\u00fcn parlakl\u0131\u011f\u0131na kar\u015f\u0131l\u0131k geldi\u011fi i\u00e7in, yani elektron \u0131\u015f\u0131n\u0131 numune \u00fczerinde bir noktaya \u00e7arpt\u0131\u011f\u0131nda, resim t\u00fcp\u00fcn\u00fcn ekran\u0131nda parlak bir nokta belirir. Bu \u015fekilde, taramal\u0131 elektron mikroskobu (SEM), bir g\u00f6r\u00fcnt\u00fc \u00e7er\u00e7evesini tamamlamak i\u00e7in \u00f6rnek y\u00fczeyinin farkl\u0131 \u00f6zelliklerini orant\u0131l\u0131 olarak video sinyallerine d\u00f6n\u00fc\u015ft\u00fcrmek i\u00e7in noktadan noktaya g\u00f6r\u00fcnt\u00fcleme y\u00f6ntemini kullan\u0131r, b\u00f6ylece \u00e7e\u015fitli karakteristik g\u00f6r\u00fcnt\u00fcleri g\u00f6zlemleyebiliriz. Floresan ekranda numune y\u00fczeyi.<\/p>\n\n\n\n

Taramal\u0131 Elektron Mikroskobu Eki<\/h2>\n\n\n\n

Taramal\u0131 elektron mikroskobu (SEM) genellikle bir spektrometre veya bir enerji spektrometresi ile donat\u0131lm\u0131\u015ft\u0131r. Spektrometre, X-\u0131\u015f\u0131nlar\u0131n\u0131 numuneden uyarmak ve bunlar\u0131 uygun kristallerle ay\u0131rmak i\u00e7in Bragg denklemi 2dsin'i (= () kullan\u0131r. Farkl\u0131 dalga boylar\u0131na sahip karakteristik X-\u0131\u015f\u0131nlar\u0131, 2'lik farkl\u0131 k\u0131r\u0131lma a\u00e7\u0131lar\u0131na sahip olacakt\u0131r (). Spektrometre, a\u015fa\u011f\u0131dakiler i\u00e7in g\u00fc\u00e7l\u00fc bir ara\u00e7t\u0131r: mikro alan bile\u015fen analizi Spektrometrenin dalga boyu \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc \u00e7ok y\u00fcksektir, ancak X-\u0131\u015f\u0131n\u0131n\u0131n d\u00fc\u015f\u00fck kullan\u0131m\u0131 nedeniyle uygulama aral\u0131\u011f\u0131 s\u0131n\u0131rl\u0131d\u0131r.Enerji spektrometresi, X-\u0131\u015f\u0131n\u0131 kuantumunun enerji fark\u0131na dayal\u0131 bir element analizi y\u00f6ntemidir. Bir element i\u00e7in, X-\u0131\u015f\u0131n\u0131 kuantumu ana kuantum say\u0131s\u0131 mide N1'den ana kuantum say\u0131s\u0131 n2'ye ge\u00e7ti\u011finde, belirli bir enerji vard\u0131r (=(n1-(n2)). Enerji da\u011f\u0131l\u0131ml\u0131 spektrometre y\u00fcksek \u00e7\u00f6z\u00fcn\u00fcrl\u00fckl\u00fc ve h\u0131zl\u0131 analiz h\u0131z\u0131na sahiptir. , ancak \u00e7\u00f6z\u00fcn\u00fcrl\u00fck yetene\u011fi zay\u0131f.\u00c7o\u011fu zaman \u00e7ak\u0131\u015fan \u00e7izgiler vard\u0131r ve d\u00fc\u015f\u00fck i\u00e7erik i\u00e7in \u00f6\u011fe analizinin do\u011frulu\u011fu \u00e7ok zay\u0131ft\u0131r.<\/p>\n\n\n\n

Spektrometreler ve enerji spektrometreleri birbirinin yerine ge\u00e7emez, birbirini tamamlar.<\/p>\n\n\n\n

Taramal\u0131 Elektron Mikroskobunun Malzeme Biliminde Uygulanmas\u0131<\/h2>\n\n\n\n

Malzemelerin Y\u00fczey Morfolojisinin G\u00f6zlemlenmesi<\/h3>\n\n\n\n
\"\"<\/figure>\n\n\n\n

<\/p>\n\n\n\n

\u015eEK\u0130L 1 SICAK HADDELENM\u0130\u015e Mg YANDAN SOYMA Y\u00dcZEY\u0130N\u0130N SEM MORFOLOJ\u0130S\u0130<\/p>\n\n\n\n

S\u0131cak haddelenmi\u015f Al-Mg kapl\u0131 sac\u0131n Mg taraf\u0131 soyulma y\u00fczeyinin SEM morfolojisi (haddeleme s\u0131cakl\u0131\u011f\u0131 400 C, indirgeme oran\u0131 45%) \u015eekil 1'de g\u00f6sterilmektedir. Grafikten, \u00e7ok say\u0131da y\u0131rt\u0131lma kenar\u0131 ve platform oldu\u011funu a\u00e7\u0131k\u00e7a g\u00f6rebiliriz. soyma y\u00fczeyinde ve y\u0131rtma platformunda \u00e7ok say\u0131da k\u00fc\u00e7\u00fck radyal \u015feritler ve \u00e7ukurlar vard\u0131r.<\/p>\n\n\n\n

Malzemeyi G\u00f6zlemlemenin \u0130kinci A\u015famas\u0131<\/h3>\n\n\n\n
\"\"<\/figure>\n\n\n\n

\u015eekil 2 SEM ile AZ31 Magnezyum Ala\u015f\u0131m\u0131n\u0131n Y\u00fcksek G\u00fc\u00e7l\u00fc Mikro Yap\u0131s\u0131<\/p>\n\n\n\n

\u015eekil 2'den, par\u00e7alanmadan sonraki ikinci faz Mg17Al12'nin boyutunun yakla\u015f\u0131k 4 m oldu\u011fu ve yakla\u015f\u0131k 0,5 m boyutunda Mg17Al12 "y\u0131\u011f\u0131n" yak\u0131n\u0131nda bir\u00e7ok da\u011f\u0131lm\u0131\u015f k\u00fc\u00e7\u00fck par\u00e7ac\u0131k oldu\u011fu a\u00e7\u0131k\u00e7a g\u00f6r\u00fclebilir. Bu, s\u0131cak haddelemeden sonra so\u011futma i\u015flemi s\u0131ras\u0131nda a-Mg baz\u0131n\u0131n a\u015f\u0131r\u0131 doymu\u015f kat\u0131 \u00e7\u00f6zeltisinden \u00e7\u00f6keltilen ikinci faz Mg17Al12'dir ve bu morfolojik da\u011f\u0131l\u0131m\u0131n inceli\u011fini g\u00f6sterir. Bifazik Mg17Al12, dislokasyon hareketini etkili bir \u015fekilde engelleyebilir, malzeme mukavemetini art\u0131rabilir ve da\u011f\u0131l\u0131m g\u00fc\u00e7lendirme rol\u00fcn\u00fc oynayabilir, ancak AZ31 magnezyum ala\u015f\u0131m\u0131n\u0131n plastisitesini \u00f6nemli \u00f6l\u00e7\u00fcde azaltmayacakt\u0131r.<\/p>\n\n\n\n

Malzeme Aray\u00fcz\u00fcn\u00fcn G\u00f6zlemlenmesi<\/h3>\n\n\n\n
\"\"<\/figure>\n\n\n\n

\u015eekil 3 Mg\/Al haddeleme aray\u00fcz\u00fc hat taramas\u0131 [1]<\/p>\n\n\n\n

\u015eekil 3, Mg\/Al yuvarlanan kompozit aray\u00fcz\u00fcn bir \u00e7izgi tarama g\u00f6r\u00fcnt\u00fcs\u00fcd\u00fcr. Grafikten, Mg ve Al aras\u0131ndaki aray\u00fcz \u00fczerinden \u00e7izgi taramas\u0131n\u0131n elde edilebilece\u011fini g\u00f6rebiliriz. Al taraf\u0131nda Mg i\u00e7eri\u011fi d\u00fc\u015f\u00fckt\u00fcr ve Mg taraf\u0131nda Al neredeyse s\u0131f\u0131rd\u0131r. Bununla birlikte, aray\u00fczde, Mg ve Al'nin yakla\u015f\u0131k yar\u0131s\u0131 olu\u015fur, bu da aray\u00fczde dif\u00fczyonun meydana geldi\u011fini ve Mg ve Al'yi olu\u015fturdu\u011funu g\u00f6sterir. Dif\u00fczyon tabakas\u0131.<\/p>\n\n\n\n

Malzeme k\u0131r\u0131lmas\u0131n\u0131n g\u00f6zlemlenmesi<\/h3>\n\n\n\n
\"\"<\/figure>\n\n\n\n

\n\n(a) D\u00f6k\u00fcm olarak  \n\n<\/p>\n\n\n\n

\"\"<\/figure>\n\n\n\n

 (b) S\u0131cak haddelenmi\u015f<\/p>\n\n\n\n

\u015eekil 4 AZ31 Magnezyum Ala\u015f\u0131m\u0131n\u0131n \u00c7ekme K\u0131r\u0131lmas\u0131 Morfolojisi<\/p>\n\n\n\n

D\u00f6kme AZ31 magnezyum ala\u015f\u0131m\u0131n\u0131n \u00e7ekme k\u0131r\u0131lmas\u0131n\u0131n SEM tarama morfolojisi \u015eekil 3-6'da g\u00f6sterilmektedir. \u015eekil 4 (a)'dan, bariz yar\u0131lma k\u0131r\u0131lma platformlar\u0131 ve son y\u0131rt\u0131lma noktas\u0131nda, temelde zay\u0131f plastisiteye sahip yar\u0131 yar\u0131lma k\u0131r\u0131lmas\u0131 olan birka\u00e7 \u00e7ukur oldu\u011fu g\u00f6r\u00fclebilir. Bunun nedeni, d\u00f6kme AZ31 magnezyum ala\u015f\u0131m\u0131n\u0131n tane s\u0131n\u0131r\u0131nda, \u00e7ekme deformasyonu s\u0131ras\u0131nda \u00e7atlamas\u0131 ve \u00e7atlak kayna\u011f\u0131 olu\u015fturmas\u0131 kolay, b\u00fcy\u00fck bir k\u0131r\u0131lgan ikinci faz Mg17Al12 olmas\u0131d\u0131r. S\u0131cak haddelenmi\u015f AZ31 magnezyum ala\u015f\u0131m\u0131n\u0131n k\u0131r\u0131lma morfolojisi, bariz boyunlanma olgusunu g\u00f6sterir. \u015eekil 4(b)'de g\u00f6sterildi\u011fi gibi, AZ31 magnezyum ala\u015f\u0131m\u0131n\u0131n makro k\u0131r\u0131lma morfolojisi, \u00e7ukur boyutu 5 ila 20 m aras\u0131nda de\u011fi\u015fen s\u00fcnek k\u0131r\u0131lma morfolojisi g\u00f6sterir.<\/p>\n\n\n\n

son s\u00f6zler<\/h2>\n\n\n\n

Taramal\u0131 elektron mikroskobu (SEM), malzeme biliminde yayg\u0131n olarak kullan\u0131lmaktad\u0131r. Sadece malzeme biliminin yukar\u0131daki y\u00f6nlerinde de\u011fil, ayn\u0131 zamanda metallerin yorulma ar\u0131zas\u0131nda ve safs\u0131zl\u0131klar\u0131n morfolojik g\u00f6zleminde de kullan\u0131labilir. Malzemeler alan\u0131nda uzmanla\u015fan bir \u00f6\u011frenci olarak, taramal\u0131 elektron mikroskobunun \u00e7al\u0131\u015fma prensibini ve uygulamas\u0131n\u0131 anlamal\u0131 ve kapsaml\u0131 ve titiz bir malzeme \u00e7al\u0131\u015fmas\u0131 y\u00fcr\u00fctmek i\u00e7in bilimsel ara\u015ft\u0131rmam\u0131zda taramal\u0131 elektron mikroskobu arac\u0131n\u0131 tam olarak kullanmal\u0131y\u0131z.<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"

\u0130lk ticari taramal\u0131 elektron mikroskobunun 1965'te ortaya \u00e7\u0131kmas\u0131ndan bu yana, 40 y\u0131ll\u0131k s\u00fcrekli iyile\u015ftirmenin ard\u0131ndan, taramal\u0131 elektron mikroskobunun \u00e7\u00f6z\u00fcn\u00fcrl\u00fc\u011f\u00fc ilkinin 25 nm'sinden 0.01 nm'ye y\u00fckseldi. \u00c7o\u011fu taramal\u0131 elektron mikroskobu, kapsaml\u0131 bir analiz haline gelen X-\u0131\u015f\u0131n\u0131 spektrometresi ve X-\u0131\u015f\u0131n\u0131 enerji spektrometresi ile birle\u015ftirilebilir\u2026<\/p>","protected":false},"author":2,"featured_media":19444,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[79],"tags":[],"jetpack_featured_media_url":"https:\/\/www.meetyoucarbide.com\/wp-content\/uploads\/2019\/09\/1.png","jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts\/13638"}],"collection":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/comments?post=13638"}],"version-history":[{"count":0,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/posts\/13638\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/media\/19444"}],"wp:attachment":[{"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/media?parent=13638"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/categories?post=13638"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.meetyoucarbide.com\/tr\/wp-json\/wp\/v2\/tags?post=13638"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}